XRF Spectrometers
SPECTRO XEPOS
An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance
Overview
- Measure lower than ever and faster than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in outstanding low detection limits for a wide range of elements at even shorter measurement times (up to a factor 2)
- Improved accuracy based on optimized spectra handling: Master the unknown using the benchmark in ED-XRF screening, SPECTRO’s TurboQuant II application package for the unprecedented ability to analyze unknown samples, whether they are liquids, solids or powders – whether they are tree leaves, plastics, oil, granite or glass…
- Application range extended to multilayer analysis, up to 8 layers and up to 55 elements
Gallery
Literature
- SPECTRO XEPOS (PDF, en)
- SPECTRO XRF Layers (PDF, en)
- Product Overview Brochure (PDF, en)
- Case Study Q8Oils (PDF, en)
- Case Study L`Oreal (PDF, en)
- Performance Maintenance SPECTRO XEPOS (PDF, en)
Literature is hosted by SPECTRO and opens in a new tab.