ICP-OES / AES Spectrometers
SPECTRO ARCOS
The top-of-line SPECTRO ARCOS ICP-OES analyzer evolves elemental analysis to the next level
Overview
- New Dual Side-On Interface (DSOI) adds sensitivity and eliminates contamination/matrix compatibility issues
- One instrument instead of two: Only MultiView plasma instrument in the market ‒ true axial AND true radial (single or dual) plasma observation in one instrument
- ORCA Optical System: Simultaneous spectrum capture in the 130-770 nm wavelength range with up to 5x more sensitivity than Echelle based systems ‒ delivers best in class performance in the UV/VUV range
Gallery
Literature
- SPECTRO ARCOS (PDF, en)
- SPECTRO AI QUANT (PDF, en)
- Product Overview Brochure (PDF, en)
- Case Study Eurofins (PDF, en)
- Case Study Uni Padua (PDF, en)
- Performance Maintenance SPECTRO ARCOS (PDF, en)
Literature is hosted by SPECTRO and opens in a new tab.